Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10816564 | Sample test automation system | Takahiro Sasaki, Kenichi Takahashi, Hiroshi Ohga, Tatsuya Fukugaki, Shigeru Yano +2 more | 2020-10-27 |
| 10768187 | Automatic analysis device and specimen inspection automation system | Tsuguhiko Sato, Hiroki Mori | 2020-09-08 |