Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10859606 | Offset estimation apparatus and method, correction apparatus for magnetic sensor, and current sensor | Yuta Saito, Hiraku Hirabayashi | 2020-12-08 |
| 10845383 | Semiconductor wafer test system | Sumio Shimonishi, Motochika Juso | 2020-11-24 |