Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10582099 | Sample height measurement using digital grating | Shiguang Li | 2020-03-03 |
| 10553393 | Laser-assisted electron-beam inspection for semiconductor devices | Shiguang Li, Mingcheng Zong | 2020-02-04 |