Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10692785 | Semiconductor pattern for monitoring overlay and critical dimension at post-etching stage and metrology method of the same | Chien-Hao Chen, Chia-Hung Wang, Sho-Shen Lee | 2020-06-23 |
| 10599956 | Automatic picture classifying system and method in a dining environment | — | 2020-03-24 |