Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10601678 | Localized sensor quality analysis and control | Eric J. Barkie, Benjamin J. Fletcher, Shawn Stedman | 2020-03-24 |
| 10574541 | Localized sensor quality analysis and control | Eric J. Barkie, Benjamin J. Fletcher, Shawn Stedman | 2020-02-25 |