Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10585116 | Scanning probe microscope and method for measuring local electrical potential fields | Frank Tautz, Ruslan Temirov, Christian Wagner | 2020-03-10 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10585116 | Scanning probe microscope and method for measuring local electrical potential fields | Frank Tautz, Ruslan Temirov, Christian Wagner | 2020-03-10 |