PS

Patrick J. Schiavone

AN Aselta Nanographics: 2 patents #1 of 9Top 15%
📍 Meylan, MI: #1 of 1 inventorsTop 100%
Overall (2020): #133,621 of 565,922Top 25%
2
Patents 2020

Issued Patents 2020

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10578978 Method for determining the dose corrections to be applied to an IC manufacturing process by a matching procedure Mohamed Saib, Thiago Figueiro, Sébastien Bayle 2020-03-03
10553394 Method for the correction of electron proximity effects Nader JEDIDI, Jean-Herve Tortai, Thiago Figueiro 2020-02-04