Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10732216 | Method and device of remaining life prediction for electromigration failure | Yunfei En, Xiaowen Zhang, Yun Huang, Yudong Lu | 2020-08-04 |
| 10598713 | ESD failure early warning circuit for integrated circuit | Ang Li, Dengyun Lei, Yunfei En, Lichao Hao, Wenxiao Fang +1 more | 2020-03-24 |