Issued Patents 2020
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861149 | Inspection system and method for correcting image for inspection | Fumikazu Warashina | 2020-12-08 |
| 10724963 | Device and method for calculating area to be out of inspection target of inspection system | Fumikazu Warashina | 2020-07-28 |
| 10656097 | Apparatus and method for generating operation program of inspection system | Fumikazu Warashina | 2020-05-19 |
| 10607337 | Object inspection system and object inspection method | Fumikazu Warashina | 2020-03-31 |
| 10593053 | Projection pattern creation apparatus and three-dimensional measuring apparatus | Shouta Takizawa, Fumikazu Warashina | 2020-03-17 |