Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10823701 | Methods and systems for nondestructive material inspection | Lang Feng, Qiuzi Li, Harry W. Deckman, Paul M. Chaikin, Neeraj S. Thirumalai | 2020-11-03 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10823701 | Methods and systems for nondestructive material inspection | Lang Feng, Qiuzi Li, Harry W. Deckman, Paul M. Chaikin, Neeraj S. Thirumalai | 2020-11-03 |