Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10823701 | Methods and systems for nondestructive material inspection | Lang Feng, Harry W. Deckman, Paul M. Chaikin, Neeraj S. Thirumalai, Shiun Ling | 2020-11-03 |
| 10662768 | Methods of determining a spatial distribution of an injected tracer material within a subterranean formation | Brent D. Wheelock, Mehmet Deniz Ertas, Lang Feng, Harry W. Deckman | 2020-05-26 |