Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876989 | Method for non-intrusively detecting imperfections in a test object | Laurent Bianchi, Sebastien Bernier, John Enderby, Mark Bowes | 2020-12-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876989 | Method for non-intrusively detecting imperfections in a test object | Laurent Bianchi, Sebastien Bernier, John Enderby, Mark Bowes | 2020-12-29 |