Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10830834 | Current measuring module using inspection substrate and inspection substrate | Hiroyuki Takenaka, Mitsutoshi Yahagi | 2020-11-10 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10830834 | Current measuring module using inspection substrate and inspection substrate | Hiroyuki Takenaka, Mitsutoshi Yahagi | 2020-11-10 |