Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10845187 | Multiscale deformation measurements leveraging tailorable and multispectral speckle patterns | Antonios Kontsos, Fnu Melvin Domin Mathew, Andrew James Ellenberg | 2020-11-24 |