Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10585274 | Method for capturing and compensating ambient effects in a measuring microscope | Dirk Seidel, Oliver Jaeckel | 2020-03-10 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10585274 | Method for capturing and compensating ambient effects in a measuring microscope | Dirk Seidel, Oliver Jaeckel | 2020-03-10 |