Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10845286 | Holographic method for characterizing a particle in a sample | Cedric Allier, Anais Ali Cherif, Pierre Blandin, Geoffrey Esteban, Damien Isebe | 2020-11-24 |
| 10816454 | Method for observing a sample, by calculation of a complex image | Cedric Allier | 2020-10-27 |
| 10754141 | Device for observing a sample and method for observing a sample | Cedric Allier, Thomas Bordy, Olivier Cioni, Sophie Morel | 2020-08-25 |
| 10564602 | Method for observing a sample | Cedric Allier, Thomas Bordy, Olivier Cioni, Sophie Morel | 2020-02-18 |