| #114 |
Scott Gerger |
Verification Technologies |
1 |
| #114 |
Stephen C. Morgana |
Xerox |
1 |
| #114 |
Andrew Jabrucki |
Synaptics Incorporated |
1 |
| #114 |
Sheila Bello-Irizarry |
University Of Rochester |
1 |
| #114 |
Victor C. Wong |
Carestream Health |
1 |
| #114 |
Eliud Robles-Flores |
Xerox |
1 |
| #114 |
Frank B. Tamarez Gomez |
Xerox |
1 |
| #114 |
Survi Kyal |
Xerox |
1 |
| #114 |
Christopher C. Distasio |
Caliber Imaging & Diagnostics |
1 |
| #114 |
Matthew P. Harrigan |
Rigetti & Co |
1 |
| #114 |
Daniel N. Kelly |
Scott Archery |
1 |
| #114 |
Garry J. Sullivan |
IBM |
1 |
| #114 |
Michael Knauf |
Delphi Technologies |
1 |
| #114 |
James E. McGarvey |
Eastman Kodak |
1 |
| #114 |
Sebastian Caccamo |
— |
1 |
| #114 |
Aaron T. Corette |
IBM |
1 |
| #114 |
William Wade Cook |
— |
1 |
| #114 |
Hidalberto Dejesus |
— |
1 |
| #114 |
Emin Engin |
Bausch & Lomb Incorporated |
1 |
| #114 |
Phillip Dalo |
Colgate-Palmolive |
1 |
| #114 |
Mark E. Mang |
Xerox |
1 |
| #114 |
David M. Skinner |
Xerox |
1 |
| #114 |
Anthony DiRisio |
Eastman Kodak |
1 |
| #114 |
Richard Bomba |
Corning Incorporated |
1 |
| #114 |
Dongfang Liu |
MIT |
1 |
| #114 |
Michael T. Kurdziel |
Harris |
1 |
| #114 |
Alexander Tseitlin |
Novomer |
1 |
| #114 |
Paul F. Sawicki |
Xerox |
1 |
| #114 |
Christopher R. Wulff |
Biamp Systems |
1 |
| #114 |
Christopher Mieney |
Xerox |
1 |
| #114 |
Mitchell Anthamatten |
University Of Rochester |
1 |
| #114 |
Philip C. Hosimer |
Ortho-Clinical Diagnostics |
1 |
| #114 |
Chieh-Min Cheng |
Xerox |
1 |
| #114 |
Andrew S. Fulton |
Crosman |
1 |
| #114 |
Alan Kaminsky |
Harris |
1 |
| #114 |
David K. Rhoda |
Kodak Alaris |
1 |
| #114 |
Ivan A. Belashov |
Colorado State University |
1 |
| #114 |
Alvaro Enrique Gil |
Xerox |
1 |
| #114 |
Todd D. Bogumil |
General Motors |
1 |
| #114 |
Joseph F. Bringley |
Eastman Kodak |
1 |
| #114 |
Kevin D. Schuster |
University Of New Hempshire |
1 |
| #114 |
Mohammed J. Zaki |
IBM |
1 |
| #114 |
Kenneth A. Parulski |
Eastman Kodak |
1 |
| #114 |
Robert Bradacs |
Pictometry International |
1 |
| #114 |
James A. Roussie |
Simpore |
1 |
| #114 |
David R. Nilosek |
Pictometry International |
1 |
| #114 |
Stephen T. Pasquarella |
Va |
1 |
| #114 |
Ed Horeth |
Chapin Manufacturing |
1 |
| #114 |
Kei-Yu Ko |
Micron |
1 |
| #114 |
Marissa Forward |
Xerox |
1 |