KH

Kai-Chieh Hsieh

CC Chunghwa Precision Test Tech. Co.: 6 patents #1 of 11Top 10%
Overall (2020): #24,933 of 565,922Top 5%
6
Patents 2020

Issued Patents 2020

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
10845385 Probe card device Wen-Tsung Lee, Wei-Jhih Su 2020-11-24
10845387 Probe card device and matching probe thereof Wen-Tsung Lee, Chao-Hui Tseng, Hsien-Yu Wang 2020-11-24
10845388 Probe card device and probe head thereof Wen-Tsung Lee, Chao-Hui Tseng, Hsien-Yu Wang 2020-11-24
10775412 Probe card testing device and testing device Wen-Tsung Lee 2020-09-15
10718791 Probe assembly and probe structure thereof YUAN-CHIANG TENG, Jian Li 2020-07-21
10705117 Probe assembly and probe structure thereof Wen-Tsung Lee, YUAN-CHIANG TENG 2020-07-07