HS

Heiko Stegmann

CG Carl Zeiss Microscopy Gmbh: 2 patents #14 of 93Top 20%
📍 Dresden, DE: #42 of 370 inventorsTop 15%
Overall (2020): #168,875 of 565,922Top 30%
2
Patents 2020

Issued Patents 2020

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10854421 Charged particle beam system and method Daniela Donhauser, Christian Mueller, Barry Chamley, Tobias Volkenandt, Dirk Preikszas +1 more 2020-12-01
10796881 Method for processing an object 2020-10-06