TO

Takeshi Okazaki

AB Aon Benfield: 2 patents #1 of 1Top 100%
Overall (2020): #115,786 of 565,922Top 25%
2
Patents 2020

Issued Patents 2020

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10650285 Platform, systems, and methods for identifying property characteristics and property feature conditions through aerial imagery analysis 2020-05-12
10529029 Platform, systems, and methods for identifying property characteristics and property feature maintenance through aerial imagery analysis 2020-01-07