Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10768118 | Surface defect inspection device and method | Masato Kashihara, Taizo Wakimura | 2020-09-08 |
| 10578491 | Colorimetry device and colorimetry method | Yasutaka Tanimura, Ryoji Bando | 2020-03-03 |