Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10730071 | Method for producing a plurality of measurement regions on a chip, and chip having a plurality of measurement regions | Axel Niemeyer, Matthias Griessner | 2020-08-04 |
| 10597703 | Analysis system and method for testing a sample | Matthias Griessner | 2020-03-24 |
| 10599894 | Cartridge and analysis system for testing a sample | Axel Niemeyer, Kai Wuerz | 2020-03-24 |