Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10705114 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Jason Cleveland | 2020-07-07 |
| 10556793 | Thermal measurements using multiple frequency atomic force microscopy | Anil Gannepalli | 2020-02-11 |
| 10557865 | Quantitative measurements using multiple frequency atomic force microscopy | Jason Bemis | 2020-02-11 |