JQ

Johannes Anna Quaedackers

MI Mitutoyo: 3 patents #7 of 122Top 6%
AB Asml Netherlands B.V.: 1 patents #317 of 801Top 40%
Overall (2020): #51,922 of 565,922Top 10%
4
Patents 2020

Issued Patents 2020

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
10838310 Lithographic apparatus and device manufacturing method involving a heater Theodorus Petrus Maria Cadee, Johannes Henricus Wilhelmus Jacobs, Nicolaas Ten Kate, Erik Roelof Loopstra, Aschwin Lodewijk Hendricus Johannes Van Meer +20 more 2020-11-17
10794688 Optical interference measuring device Ken Motohashi, Adriaan Tiemen ZUIDERWEG 2020-10-06
10636157 Method and system for calculating a height map of a surface of an object from an image stack in scanning optical 2.5D profiling of the surface by an optical system 2020-04-28
10563974 Method for measuring a height map of multiple fields of view and combining them to a composite height map with minimized sensitivity to instrument drift Adriaan Tiemen ZUIDERWEG 2020-02-18