Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10713771 | Methods and systems for inspection of wafers and reticles using designer intent data | Paul Frank Marella, Sharon McCauley, Ellis Chang, William Volk, Sterling Watson +2 more | 2020-07-14 |
| 10571800 | Mask assembly and associated methods | Derk Servatius Gertruda Brouns, Dennis De Graaf, Robertus Cornelis Martinus De Kruif, Paul Janssen, Matthias Kruizinga +3 more | 2020-02-25 |