Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10571406 | Method of performing metrology operations and system thereof | Ron Katzir, Lavi Jacov Shachar, Amit Batikoff, Shaul Cohen, Noam Zac | 2020-02-25 |
| 10545490 | Method of inspecting a specimen and system thereof | Michele Dalla-Torre, Amit Batikoff, Efrat Rozenman, Ron Katzir | 2020-01-28 |