Issued Patents 2020
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10655949 | Inspecting a multilayer sample | Alexander Pravdivtsev | 2020-05-19 |
| 10621739 | Characterization of specular surfaces | Wei-Chun Hung | 2020-04-14 |
| 10584958 | Error reduction in measurement of samples of materials | — | 2020-03-10 |
| 10563975 | Dual-sensor arrangment for inspecting slab of material | — | 2020-02-18 |
| 10553623 | Non-contact measurement of a stress in a film on a substrate | Oanh Nguyen | 2020-02-04 |
| 10551163 | Multi-probe gauge for slab characterization | — | 2020-02-04 |
| 10533841 | Measurement of surface topography of a work-piece | — | 2020-01-14 |