Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10866331 | X-ray inspection apparatus | Naoya Saito | 2020-12-15 |
| 10718725 | X-ray inspection apparatus and correction method for X-ray inspection apparatus | Akihiro Tanaka, Takashi Kanai, Hisashi Hayashi | 2020-07-21 |