Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10418320 | Structure and method for improving high voltage breakdown reliability of a microelectronic device | Jeffrey Alan West, Byron Lovell Williams, David Leonard Larkin | 2019-09-17 |
| 10211303 | Low cost flash memory fabrication flow based on metal gate process | Ning Tan | 2019-02-19 |