Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10499876 | Test key design to enable X-ray scatterometry measurement | Chung-Li Huang, Yi-Hung Lin, Chungwei Wang | 2019-12-10 |
SF
Shyh-Shin Ferng
Overall (2019): #275,309 of 560,194Top 50%
1
Patents 2019