Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10445225 | Command coverage analyzer | Chandramouli Gopalakrishnan, Subramanian Chebiyam, Neeraj Surana, Santosh Kulkarni | 2019-10-15 |
| 10254343 | Layout-aware test pattern generation and fault detection | Alodeep Sanyal, Girish A. Patankar, Salvatore Talluto | 2019-04-09 |
| 10203370 | Scheme for masking output of scan chains in test circuit | Jyotirmoy Saikia | 2019-02-12 |