Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10295477 | Methods for defect inspection, sorting, and manufacturing photomask blank | Tsuneo Terasawa, Hiroshi Fukuda, Takahiro KISHITA, Daisuke Iwai | 2019-05-21 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10295477 | Methods for defect inspection, sorting, and manufacturing photomask blank | Tsuneo Terasawa, Hiroshi Fukuda, Takahiro KISHITA, Daisuke Iwai | 2019-05-21 |