Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10488347 | Defect classification method, method of sorting photomask blanks, and method of manufacturing mask blank | Hiroshi Fukuda, Daisuke Iwai | 2019-11-26 |
| 10295477 | Methods for defect inspection, sorting, and manufacturing photomask blank | Hiroshi Fukuda, Atsushi YOKOHATA, Takahiro KISHITA, Daisuke Iwai | 2019-05-21 |