Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10461000 | Semiconductor wafer and method of probe testing | Michael J. Seddon | 2019-10-29 |
| 10170381 | Semiconductor wafer and method of backside probe testing through opening in film frame | Michael J. Seddon | 2019-01-01 |