Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10373796 | Method of inspecting wafer using electron beam | Souk Kim, Chung-Sam Jun, Woo-Seok Ko, Sang-Kil Lee, Kwang Il Shin +1 more | 2019-08-06 |
MY
Min-chul Yoon
Overall (2019): #336,909 of 560,194Top 65%
1
Patents 2019