TL

Tao Li

NM National Institute Of Metrology: 2 patents #1 of 9Top 15%
Overall (2019): #115,255 of 560,194Top 25%
2
Patents 2019

Issued Patents 2019

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10378950 High accuracy measuring device for measuring large mass Jian Wang, Changqing Cai, Xiaoping Ren, Manhong Hu, Xiaolei Wang +3 more 2019-08-13
10274362 Measuring device for measuring large mass with optical refraction and displacement measuring Jian Wang, Changqing Cai, Xiaoping Ren, Manhong Hu, Xiaolei Wang +3 more 2019-04-30