XW

Xiaolei Wang

NM National Institute Of Metrology: 2 patents #1 of 9Top 15%
📍 Tangshan City, TX: #1 of 1 inventorsTop 100%
Overall (2019): #62,736 of 560,194Top 15%
3
Patents 2019

Issued Patents 2019

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
10378950 High accuracy measuring device for measuring large mass Jian Wang, Changqing Cai, Xiaoping Ren, Tao Li, Manhong Hu +3 more 2019-08-13
10312345 Transistor having a gate with a variable work function and method for manufacturing the same Jinjuan Xiang, Hong Yang, Shi-Huei Liu, Junfeng Li, Wenwu Wang +1 more 2019-06-04
10274362 Measuring device for measuring large mass with optical refraction and displacement measuring Jian Wang, Changqing Cai, Xiaoping Ren, Tao Li, Manhong Hu +3 more 2019-04-30