Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10444258 | AM/FM measurements using multiple frequency atomic force microscopy | Roger Proksch, Jason Bemis | 2019-10-15 |
| 10338096 | Metrological scanning probe microscope | Deron Walters, Jason Cleveland, Roger Proksch | 2019-07-02 |