Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10444258 | AM/FM measurements using multiple frequency atomic force microscopy | Jason Bemis, Aleksander Labuda | 2019-10-15 |
| 10416190 | Modular atomic force microscope with environmental controls | Mario Viani, Maarten Rutgers, Jason Cleveland, Jim Hodgson | 2019-09-17 |
| 10338096 | Metrological scanning probe microscope | Aleksander Labuda, Deron Walters, Jason Cleveland | 2019-07-02 |
| 10215773 | Material property measurements using multiple frequency atomic force microscopy | Roger C. Callahan | 2019-02-26 |