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Granular dynamic test systems and methods |
Milind Sonawane, Adarsh Kalliat Balagopala, Amit Sanghani |
2019-11-19 |
| 10473720 |
Dynamic independent test partition clock |
Pavan Kumar Datla Jagannadha, Dheepakkumaran Jayaraman, Anubhav Sinha, Karthikeyan Natarajan, Amit Sanghani +2 more |
2019-11-12 |
| 10451676 |
Method and system for dynamic standard test access (DSTA) for a logic block reuse |
Milind Sonawane, Amit Sanghani, Jonathon E. Colburn, Bala Tarun Nelapatla, Sailendra Chadalavda +3 more |
2019-10-22 |
| 10444280 |
Independent test partition clock coordination across multiple test partitions |
Dheepakkumaran Jayaraman, Karthikeyan Natarajan, Amit Sanghani, Milind Sonawane, Sailendra Chadalavda +4 more |
2019-10-15 |
| 10317463 |
Scan system interface (SSI) module |
Milind Sonawane, Amit Sanghani, Jonathon E. Colburn, Rajendra Kumar reddy.S, Bala Tarun Nelapatla +1 more |
2019-06-11 |
| 10281524 |
Test partition external input/output interface control for test partitions in a semiconductor |
Sailendra Chadalavda, Milind Sonawane, Amit Sanghani, Jonathon E. Colburn, Dan Tobin Smith +2 more |
2019-05-07 |