Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10365163 | Optical critical dimension metrology | Gilad Barak, Danny Grossman | 2019-07-30 |
| 10365231 | Optical phase measurement method and system | Gilad Barak, Yanir Hainick, Shahar Gov | 2019-07-30 |
| 10311198 | Overlay design optimization | Gilad Barak, Tal Verdene, Michal Haim YACHINI, Changman Moon, Shay Wolfling | 2019-06-04 |