Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466271 | Scanning probe microscope and optical axis adjustment method for scanning probe microscope | Toshihiro Ueno, Susumu Ito, Shoichi Hasegawa | 2019-11-05 |
| 10360378 | Analysis device, analysis method and computer-readable recording medium | Yuki Ashino | 2019-07-23 |