Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466271 | Scanning probe microscope and optical axis adjustment method for scanning probe microscope | Masafumi Watanabe, Toshihiro Ueno, Shoichi Hasegawa | 2019-11-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466271 | Scanning probe microscope and optical axis adjustment method for scanning probe microscope | Masafumi Watanabe, Toshihiro Ueno, Shoichi Hasegawa | 2019-11-05 |