Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10324129 | Integrated circuit automatic test system and integrated circuit automatic test method storing test data in scan chains | Ping TANG | 2019-06-18 |
| 10324130 | Test decompressor and test method thereof | Jhen-Zong Chen | 2019-06-18 |