Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10324129 | Integrated circuit automatic test system and integrated circuit automatic test method storing test data in scan chains | Kuen-Jong Lee | 2019-06-18 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10324129 | Integrated circuit automatic test system and integrated circuit automatic test method storing test data in scan chains | Kuen-Jong Lee | 2019-06-18 |