RT

Ryan Tsai

NI Nanometrics Incorporated: 1 patents #3 of 17Top 20%
📍 Sunnyvale, CA: #1,321 of 3,108 inventorsTop 45%
🗺 California: #27,528 of 67,890 inventorsTop 45%
Overall (2019): #287,234 of 560,194Top 55%
1
Patents 2019

Issued Patents 2019

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10451542 Local purge within metrology and inspection systems Paul Doyle, Morgan A. Crouch 2019-10-22