PD

Paul Doyle

NI Nanometrics Incorporated: 1 patents #3 of 17Top 20%
📍 Milpitas, CA: #220 of 588 inventorsTop 40%
🗺 California: #27,528 of 67,890 inventorsTop 45%
Overall (2019): #320,361 of 560,194Top 60%
1
Patents 2019

Issued Patents 2019

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10451542 Local purge within metrology and inspection systems Ryan Tsai, Morgan A. Crouch 2019-10-22