Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10274435 | Method and system for optical metrology in patterned structures | Yanir Hainick, Vladimir Machavariani, Roy Koret, Gilad Barak | 2019-04-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10274435 | Method and system for optical metrology in patterned structures | Yanir Hainick, Vladimir Machavariani, Roy Koret, Gilad Barak | 2019-04-30 |