Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10432248 | RF metrology system for a substrate processing apparatus incorporating RF sensors with corresponding lock-in amplifiers | John C. Valcore, Jr. | 2019-10-01 |
EH
Ernest Beauel Hanks
Overall (2019): #475,033 of 560,194Top 85%
1
Patents 2019