Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10359613 | Optical measurement of step size and plated metal thickness | James Jianguo Xu, Budi Hartono | 2019-07-23 |
| 10338009 | Method and apparatus to detect defects in transparent solids | Steven W. Meeks | 2019-07-02 |
| 10209501 | 3D microscope and methods of measuring patterned substrates | Zhen Hou, James Jianguo Xu, Ken Kinsun Lee, James Nelson Stainton, Hung Phi Nguyen +1 more | 2019-02-19 |
| 10168524 | Optical measurement of bump hieght | James Jianguo Xu | 2019-01-01 |